A Finite Energy Bandwidth-Based Diffraction Simulation Framework for Thermal Processing Applications

Published

October 22, 2020

Author(s)

Darren C. Pagan, Kevontrez Jones, Joel Bernier, Thien Q. Phan

Abstract

We present a novel finite energy bandwidth-based diffraction simulation framework to aid the analysis of X-ray diffraction patterns gathered during in-situ advanced manufacturing processes. The framework generates two-dimensional diffraction patterns that simulate the effects of X-ray energy distributions typical of monochromating optics and uses microstructure and thermomechanical fields from advanced manufacturing simulations as input. As a demonstration of the capabilities of the framework, we model diffraction associated with selective laser melting of the nickel-based superalloy Inconel 625, employing a finite element thermal model for the input. The simulated diffraction patterns correspond to material volumes exhibiting large temperature gradients consistent with additive manufacturing processes, and we illustrate their utility for interpreting in-situ data.

Citation

JOM Journal of the Minerals Metals and Materials Society

Volume

72

Issue

12

Pub Type

Journals

Download Paper

https://doi.org/10.1007/s11837-020-04443-7

Local Download

Keywords

Synchrotron X-ray diffraction, Additive Manufacturing

Citation

Pagan, D. , Jones, K. , Bernier, J. and Phan, T. (2020), A Finite Energy Bandwidth-Based Diffraction Simulation Framework for Thermal Processing Applications, JOM Journal of the Minerals Metals and Materials Society, [online], https://doi.org/10.1007/s11837-020-04443-7, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=930859 (Accessed October 14, 2025)