NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.
Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.
An official website of the United States government
Here’s how you know
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Feng Yi, Shane Arlington, Justin Gorham, William Alexander Osborn, Slavomir Nemsak, Ethan Crumlin, David A. LaVan
Abstract
The formation and thermal stability of Pt surface oxides on Pt thin film were studied in situ using ambient pressure x-ray photoelectron spectroscopy (AP-XPS). AP-XPS allows us to monitor the chemical states of both adsorbed reactants and underlying material surfaces under near atmosphere pressure. The surface Pt oxide was gradually formed, evidenced by the O 1s peak at 529.5 eV as the Pt film was heated in oxygen (550 mTorr). The Pt oxide peak reached its maximum between 217 °C and 317 °C, then decreased as the sample temperature was further increased. During cooling to room temperature from 480 °C, the Pt oxide peak first increased then decreased. The remaining Pt surface oxides partially decomposed during pumping to ultra-high vacuum and completely decomposed during heating the sample in vacuum. These results have important implications for the understanding of the surface state of platinum films in different environments and the potential catalytic mechanisms of platinum.
Yi, F.
, Arlington, S.
, Gorham, J.
, Osborn, W.
, Nemsak, S.
, Crumlin, E.
and LaVan, D.
(2022),
Growth and Decomposition of Pt Surface Oxides, The Journal of Physical Chemistry Letters, [online], https://doi.org/10.1021/acs.jpclett.2c00343, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=933063
(Accessed October 1, 2025)