NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.
Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.
An official website of the United States government
Here’s how you know
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Development of an automated millifluidic platform and data-analysis pipeline for rapid electrochemical corrosion measurements: a pH study on Zn-Ni
Published
Author(s)
Howie Joress, Brian DeCost, Najlaa Hassan, Trevor Braun, Justin Gorham, Jason Hattrick-Simpers
Abstract
We describe the development of a millifluidic based scanning droplet cell platform for rapid and automated corrosion. This system allows for measurement of corrosion properties (e.g., open circuit potential, corrosion current through Tafel and linear polarization resistance measurements, and cyclic voltammograms) on a localized section of a planar sample. Our system is highly automated and flexible allowing for scripted changing and mixing of solutions and point-to-point motion on the sample. We have also created an automated data analysis pipeline. Here we demonstrate this tool by corroding a plate of electroplated \ceZn85Ni15} alloy at a range of pH and correlate our results with XPS measurements and literature.
Joress, H.
, DeCost, B.
, Hassan, N.
, Braun, T.
, Gorham, J.
and Hattrick-Simpers, J.
(2022),
Development of an automated millifluidic platform and data-analysis pipeline for rapid electrochemical corrosion measurements: a pH study on Zn-Ni, Electrochimica Acta, [online], https://doi.org/10.1016/j.electacta.2022.140866, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=934249
(Accessed October 1, 2025)