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Florian Bergmann, Nicholas Jungwirth, Nicholas Derimow, Bryan Bosworth, Meagan Papac, Eric Marksz, Tomasz Karpisz, Jerome Cheron, Vincenzo St. George, Angela Stelson, Benjamin Jamroz, Christian Long, Nathan Orloff
The characteristic impedance and the propagation constant fully describe a transmission line. The multiline Thru-Reflect-Line algorithm provides a direct...
Robert Lirette, Tomasz Karpisz, Malgorzata Musial, Gabriela Petculescu, Aaron Hagerstrom, Nathan Orloff, Angela Stelson
Accurate electric and acoustic material properties impact the agreement between modeled and measured piezoelectric device performance. Designing devices such...
Florian Bergmann, Meagan Papac, Benjamin Jamroz, Nicholas Jungwirth, Bryan Bosworth, Anna Osella, Tomasz Karpisz, Lucas Enright, Eric Marksz, Angela Stelson, Christian Long, Nathan Orloff, Robert Jones
Modern microchips utilize multilayer stack-ups with many interstitial layers of dielectrics. Optimizing device performance and maximizing yield requires precise...
Tomasz Karpisz, Jacob Pawlik, Johannes Hoffmann, Sarah Evans, Chris Long, Nate Orloff, Jim Booth, Angela Stelson
Here are included figures and other relevant data from the paper "On-Wafer Calibration Comparisons of Multiline TRL with Platinum and Gold Conductors" to be published in International Microwave