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An Approach to T-way Test Sequence Generation With Constraints
Published
Author(s)
Raghu N. Kacker, David R. Kuhn
Abstract
In this paper we address the problem of constraint handling in t-way test sequence generation. We develop a notation for specifying sequencing constraints and present a t-way test sequence generation that handles the constraints specified in this notation. We report a case study in which we applied our notation and test generation algorithm to a real-life communication protocol. Our experience indicates that our notation is intuitive to use and allows us to express important sequencing constraints for the protocol. However, the test generation algorithm takes a significant amount of time. This work is part of our larger effort to make t- way sequence testing practically useful.
Proceedings Title
Proceedings of IEEE International Conference on Software Testing, Verification and Validation
ICST 2019 Workshops
Conference Dates
April 22-27, 2019
Conference Location
Xian
Conference Title
IEEE International Conference on Software Testing, Verification and Validation
ICST 2019
Kacker, R.
and Kuhn, D.
(2019),
An Approach to T-way Test Sequence Generation With Constraints, Proceedings of IEEE International Conference on Software Testing, Verification and Validation
ICST 2019 Workshops, Xian, -1, [online], https://doi.org/10.1109/ICSTW.2019.00059.
(Accessed October 1, 2025)