Kruskopf, M.
, Patel, D.
, Liu, C.
, Rigosi, A.
, Elmquist, R.
, Wang, Y.
, Bauer, S.
, Yin, Y.
, Pierz, K.
, Pesel, E.
, Goetz, M.
and Schurr, J.
(2020),
Graphene quantum Hall effect devices for AC and DC resistance metrology, 2020 Conference on Precision Electromagnetic Measurements(CPEM 2020), Denver, CO, US, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=929635
(Accessed October 6, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Graphene quantum Hall effect devices for AC and DC resistance metrology
Published
Author(s)
Mattias Kruskopf, Dinesh K. Patel, , , , , Stefan Bauer, Yefei Yin, Klaus Pierz, Eckard Pesel, Martin Goetz, Jurgen Schurr
Abstract
The frequency dependence of the quantized Hall resistance at alternating current results from capacitive losses inside the sample as well as between the sample and external parts. In this joint effort we report on ac quantum Hall measurements of a graphene-based Hall bar using superconducting contacts and a new contact design approach.Proceedings Title
2020 Conference on Precision Electromagnetic Measurements(CPEM 2020)
Conference Dates
August 24-28, 2020
Conference Location
Denver, CO, US
Pub Type
Conferences
Download Paper
Keywords
electrical measurement standards, ac quantized Hall resistance, epitaxial graphene
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created August 27, 2020, Updated October 12, 2021