NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.
Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.
An official website of the United States government
Here’s how you know
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
A Programmable Transmission Electron Detector for Nanomaterials Characterization in a Scanning Electron Microscope
Published
Author(s)
Jason D. Holm, Benjamin W. Caplins, Robert R. Keller
Abstract
A new programmable detector for scanning transmission electron microscopy (pSTEM) is described. A digital micromirror array lies at the heart of the detector and serves as a programmable virtual objective aperture. Two sensors, a photomultiplier tube and a CMOS digital camera are used to enable real-space transmission imaging and on-axis diffraction, respectively. Detector operation is demonstrated with several samples in a conventional scanning electron microscope (SEM).
Holm, J.
, Caplins, B.
and Keller, R.
(2019),
A Programmable Transmission Electron Detector for Nanomaterials Characterization in a Scanning Electron Microscope, TechConnect World Technical Proceedings, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=927907
(Accessed October 1, 2025)