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Propagating Measurement Uncertainty to Microwave Amplifier Nonlinear Behavioral Models
Published
Author(s)
Dylan F. Williams, Laurence T. Stant, Martin J. Salter, Nick M. Ridler, Peter Aaen
Abstract
We propagate for the first time correlated measurement uncertainties into a nonlinear behavioral model of a millimetre-wave amplifier. We make use of the NIST Microwave Uncertainty Framework to evaluate the uncertainties in large-signal electromagnetic wave measurements of an amplifier, followed by the extraction of X-parameters using an industry standard algorithm. This extracted model is included as a component in a circuit simulator to evaluate gain and efficiency incorporating measurement uncertainty.
Citation
IEEE Transactions on Microwave Theory and Techniques
Williams, D.
, Stant, L.
, Salter, M.
, Ridler, N.
and Aaen, P.
(2019),
Propagating Measurement Uncertainty to Microwave Amplifier Nonlinear Behavioral Models, IEEE Transactions on Microwave Theory and Techniques, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=925492
(Accessed October 1, 2025)