Measuring the Leakage Current to Ground in Programmable Josephson Voltage Standards

Published

July 7, 2018

Author(s)

Alain Rufenacht, Charles J. Burroughs, Paul Dresselhaus, Samuel P. Benz

Abstract

The voltage error associated with the leakage current of programmable Josephson voltage standards (PJVS) is one of the largest contributions to the uncertainty in direct comparison of voltage standards. Due to the parallel biasing scheme of the PJVS and the resulting multiple leakage paths, the quantities "leakage resistance" and "leakage current" are not necessarily equivalent. A method to measure and model the leakage current to ground for a given PJVS output voltage is presented. By upgrading simple components of our system, the leakage current to ground can be reduced from 250 pA to 50 pA at 10 V.

Proceedings Title

2018 Conference on Precision Electromagnetic Measurements

Conference Dates

July 8-13, 2018

Conference Location

Paris, FR

Pub Type

Conferences

Download Paper

https://doi.org/10.1109/CPEM.2018.8500911

Local Download

Keywords

Digital-analog conversion, Josephson arrays, Standards, Superconducting integrated circuits, Voltage measurement

Citation

Rufenacht, A. , Burroughs, C. , Dresselhaus, P. and Benz, S. (2018), Measuring the Leakage Current to Ground in Programmable Josephson Voltage Standards, 2018 Conference on Precision Electromagnetic Measurements, Paris, FR, [online], https://doi.org/10.1109/CPEM.2018.8500911, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=925118 (Accessed October 14, 2025)