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PUBLICATIONS

A Capacitance Standard Based on Counting Electrons

Published

Author(s)

Mark W. Keller, Ali L. Eichenberger, John M. Martinis, Neil M. Zimmerman

Abstract

A capacitance standard based directly on the definition of capacitance was built. Single-electron tunneling devices were used to place N electrons of charge e onto a cryogenic capacitor C, and the resulting voltage change ΔV was measured. Repeated measurements of C 5 Ne/ΔV with this method have a relative standard deviation of 0.3 x 10^-6. This standard offers a natural basis for capacitance analogous to the Josephson effect for voltage and the quantum Hall effect for resistance.
Citation
Science Magazine
Volume
285
Pub Type
Journals

Download Paper

Local Download

Citation

Keller, M. , Eichenberger, A. , Martinis, J. and Zimmerman, N. (1999), A Capacitance Standard Based on Counting Electrons, Science Magazine, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=926555 (Accessed October 26, 2025)

Issues

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Created September 10, 1999, Updated August 15, 2018
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