Full four-dimensional and reciprocal Mueller matrix bidirectional reflectance distribution function of sintered polytetrafluoroethylene

Published

November 20, 2017

Author(s)

Thomas A. Germer

Abstract

We measured the Mueller matrix bidirectional reflectance distribution function (BRDF) of a sintered polytetrafluoroethylene (PTFE) sample over the scattering hemisphere for six incident angles (0◦ to 75◦ in 15◦ steps) and for four wavelengths (351 nm, 532 nm, 633 nm, and 1064 nm). The data for each wavelength were fit to a phenomenological description for the Mueller matrix BRDF that is an extension of the bidirectional surface scattering modes developed by Koenderink and van Doorn [J. Opt. Soc. Am. A 15, 2903-2912 (1998)] for unpolarized BRDF. This description is designed to be complete, to obey the appropriate reciprocity conditions, and to provide a full description of the Mueller matrix BRDF as a function of incident and scattering directions for each wavelength. The description was further extended by linearizing the surface scattering mode coefficients with wavelength. This dataset and its parameterization provides a comprehensive on-demand description of the reflectance properties for this commonly used diffuse reflectance reference material over a wide range of wavelengths.

Citation

Applied Optics

Volume

56

Issue

33

Pub Type

Journals

Download Paper

https://doi.org/10.1364/AO.56.009333

Keywords

BRDF, Mueller matrix, PTFE, reflectance

Citation

Germer, T. (2017), Full four-dimensional and reciprocal Mueller matrix bidirectional reflectance distribution function of sintered polytetrafluoroethylene, Applied Optics, [online], https://doi.org/10.1364/AO.56.009333 (Accessed October 16, 2025)