Motayed, A.
, Davydov, A.
, Sharma, D.
and Li, Q.
(2015),
Transfer-characteristics and low-frequency noise in single and multi-layer MoS2 field-effect transistors, Applied Physics Letters
(Accessed May 11, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Transfer-characteristics and low-frequency noise in single and multi-layer MoS2 field-effect transistors
Published
Author(s)
, , ,
Citation
Applied Physics Letters
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created October 19, 2015, Updated March 15, 2017