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Dean DeLongchamp (Fed)

Research

I lead the Polymer Processing Group, which develops measurement methods, data, standards, and science for the processing and manufacturing of materials into functional forms that include thin films, nanostructures, and shaped bulk solids. We provide expertise in in situ processing measurements, structure and order evolution, nanofabrication, polymer phase behavior, and polymer dynamics needed to improve the performance of materials in application areas such as energy and electronics.

My work also includes a specialization in soft X-ray spectroscopy and scattering, which are powerful synchrotron-based tools that measures the composition and molecular orientation of organic systems.

Research Opportunities

National Research Council Postdoctoral Fellowship – Open to U.S. citizens. Please contact me if you're interested in applying! 

 

Awards

  • NIST Postdoctoral and Early-career Association of Researchers (PEAR) Advisor Accolade (2022)
  • Arthur S. Flemming Award (2015)
  • National Academies of Engineering Indo-US Frontiers (2012)
  • National Academies of Science Kavli Fellow (2010)
  • NIST William P. Slichter Award (2010)
  • Presidential Early Career Award for Scientists and Engineers (PECASE) (2009)
  • NIST Bronze Medal Award (2008)
  • Sigma Xi young Investigator Award (2008
  • NRC/NIST Postdoctoral Fellow Appointment (2003)
  • NSF/KOSEF Korea Summer Institute Award (2002)
  • MRS Graduate Student Award (2002)
  • National Defense Science and Engineering Graduate Fellowship Appointment (1998)

Publications

Quantitative relationships between film morphology, charge carrier dynamics, and photovoltaic performance in bulk-heterojunction binary vs. ternary acceptor blends

Author(s)
Weigang Zhu, Guoping Li, Subhrangsu Mukherjee, Natalia Powers-Riggs, Leighton Jones, Eliot Gann, R Joseph Kline, Andrew Herzing, Jenna Logsdon, Lucas Flagg, Charlotte Stern, Ryan Young, Kevin Kohlstedt, George Schatz, Dean DeLongchamp, Michael Wasielewski, Ferdinand Melkonyan, Antonio Facchetti, Tobin Marks
Addressing pertinent and perplexing questions regarding why nonfullerene acceptors (NFAs) promote higher power conversion efficiencies (PCEs) than traditional

Data and Software Publications

CyRSoXS: A GPU-accelerated virtual instrument for Polarized Resonant Soft X-ray Scattering (P-RSoXS)

Author(s)
Kumar Saurabh, Peter J. Dudenas, Eliot Gann, Veronica Reynolds, Subhrangsu Mukherjee, Daniel Sunday, Tyler Martin, Peter Beaucage, Michael Chabinyc, Dean M. DeLongchamp, Adarsh Krishnamurthy, Baskar Ganapathysubramanian
Polarized Resonant Soft X-ray scattering (P-RSoXS) has emerged as a powerful synchrotron-based tool to measure structure in complex, chemically heterogeneous systems. P-RSoXS combines principles of X
Created March 29, 2019, Updated December 8, 2022
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