Dale E. Newbury

Publications

The hazard of UV-induced oxidation to solar-viewing spacecraft optics

March 2, 2023

Author(s)

Charles S. Tarrio, Robert F. Berg, Thomas B. Lucatorto, Dale E. Newbury, Nicholas Ritchie, Andrew Jones, Frank Eparvier

The two most prevalent outgas contaminants on satellites are organic molecules and water vapor. Adsorbed organic molecules can degrade a solar-viewing...

Energy Dispersive X-ray Spectrum Simulation with NIST DTSA-II: Comparing Simulated and Measured Electron-Excited Spectra

September 2, 2022

Author(s)

Dale E. Newbury, Nicholas Ritchie

Electron-excited X-ray microanalysis with energy-dispersive spectrometry (EDS) proceeds through the application of the software that extracts characteristic X...

Energy Dispersive X-ray Spectrum Simulation with NIST DTSA-II: Comparing Simulated and Measured Electron-Excited Spectra

June 29, 2022

Author(s)

Dale E. Newbury, Nicholas Ritchie

NIST DTSA-II is an open-source, comprehensive software platform for the analysis and simulation of electron-excited energy dispersive X-ray spectra (EDS). EDS...

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Data and Software Publications

Data associated with Newbury & Ritchie "Testing the Accuracy of Low Beam Energy Electron-Excited X-ray Microanalysis with Energy Dispersive Spectrometry "

Author(s)

Dale E Newbury, Nicholas W. M. Ritchie

Data supporting: "The accuracy of electron-excited X-ray microanalysis with energy dispersive spectrometry (EDS) has been tested in the low beam energy range, specifically at an incident beam energy

Data to accompany "Low Electron Beam Energy X-ray Microanalysis: The Adventure Continues!"

Author(s)

Dale E. Newbury, Nicholas W. M. Ritchie

EDS spectra measured at E0 = 5 keV for 75 materials are provided along with the standards used for quantification with the NIST DTSA-II software for electron-excited X-ray microanalysis with energy

Dale E. Newbury (Assoc)

Publications

Data and Software Publications