Postek, M.
(1987),
Non-Destructive Submicron Dimensional Metrology Using the Scanning Electron Microscope, Plenum Publ. Corp., (Accessed May 4, 2026)
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Non-Destructive Submicron Dimensional Metrology Using the Scanning Electron Microscope
Published
Author(s)
Citation
Review of Progress in NDE 6B
Publisher Info
Plenum Publ. Corp.,
Pub Type
Books
Citation
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Created December 31, 1987, Updated February 17, 2017