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2023 George A. Uriano Award

Kevin Jurrens

Kevin Jurrens

AWARD CITATION

The team is recognized for its leadership and engagement of stakeholders to identify measurement grand challenges facing the U.S. semiconductor industry. The team's two Semiconductor Metrology Workshops and its publication of Strategic Opportunities for U.S. Semiconductor Manufacturing defined the required advances in measurements and standards needed for NIST and DOC to successfully implement core programs in the CHIPS for America Act. The programs authorized by the CHIPS Act will expand U.S. manufacturing capacity, grow the research and innovation ecosystem for microelectronics and semiconductors in the U.S., and restore U.S. leadership in semiconductor manufacturing. 

GROUP AWARD

Anita Balachandra

Industrial Specialist
CHIPS Research & Development Program Office

David Gundlach

Division Chief
Physical Measurement Laboratory, Nanoscale Device Characterization Division

Paul Hale

Division Chief
Communications Technology Laboratory, RF Technology Division

Kevin Jurrens

Division Chief
Engineering Laboratory, Intelligent Systems Division

R. Joseph Kline

Materials Research Engineer
Material Measurement Laboratory, Materials Science and Engineering Division

Timothy McBride

IT Specialist (Infosec)
Information Technology Laboratory, Applied Cybersecurity Division

Sanjay Rekhi

Supervisory IT Specialist
Information Technology Laboratory, Computer Security Division

David Seiler

Physicist
Office of Advanced Manufacturing, Policy and Strategy Division

Sivaraj Shyam-Sunder

Director
Laboratory Programs, Special Programs Office

Ndubuisi George Orji

Mechanical Engineer
CHIPS Research & Development Program Office