Dr. Ohno is recognized for his leadership of an international network of organizations that together have developed the measurement infrastructure and documentary standards needed to ensure a fair and equitable global market for solid state lighting. He served for six years as President and Vice-President of the more than 100-year-old International Commission on Illumination (CIE), the leading international authority on standards associated with lighting and lighting applications, as NIST delegate to the Consultative Committee for Photometry and Radiometry (CCPR), and worked with the International Energy Agency (IEA) to lead an intercomparison of over 100 testing labs to move technology from National Metrology Institutes to industry.