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Materials

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NIST/CSM Sensor Could Help Avert Pipeline Failures

October 1, 2008

Researchers at the National Institute of Standards and Technology (NIST) and Colorado School of Mines (CSM) have developed a prototype sensor that quickly...

NIST materials scientists Cherno Jaye (r.) and Dan Fischer adjust a sample chamber for NIST's soft x-ray materials characterization beamline at the National Synchrotron Light Source.

Slippery Customer: A Greener Antiwear Additive for Engine Oils

July 22, 2008

Titanium, a protean element with applications from pigments to aerospace alloys, could get a new role as an environmentally friendly additive for automotive oil...

3d Nanostructures with Magnetic Materials

June 24, 2008

Materials scientists at the National Institute of Standards and Technology (NIST) have developed a process to build complex, three-dimensional nanoscale...

NIST researchers measured the surface stress of a monolayer film

A Molecular 'Salve' to Sooth Surface Stresses

May 28, 2008

Researchers at the National Institute of Standards and Technology (NIST) have shown for the first time that a single layer of molecular "salve" can...

Metal Detectives: New Book Details Titanic Investigation

April 15, 2008

In February 1998, Timothy Foecke, a metallurgist at the National Institute of Standards and Technology (NIST), published a rather low-key "interagency report"...

Microscopic beads embedded in a gel surface were used to trace the motion of a gel forming an interface with a liquid.

Videos Extract Mechanical Properties of Liquid-Gel Interfaces

January 23, 2008

Blood coursing through vessels, lubricated cartilage sliding against joints, ink jets splashing on paper—living and nonliving things abound with fluids meeting...

The four images (taken with scanning laser confocal microscopy) show variations in surface roughness of an aluminum alloy as produced by increasing amounts of strain

Rough Times: NIST's New Approach to Surface Profiling

January 8, 2008

Researchers at the National Institute of Standards and Technology (NIST) have developed a novel technique for measuring the roughness of surfaces that is...

NIST Imaging System Maps Nanomechanical Properties

December 12, 2007

The National Institute of Standards and Technology (NIST) has developed an imaging system that quickly maps the mechanical properties of materials—how stiff or...

Optical micrographs of contact damage in silicon from cyclic stress showing progressive damage

Job-Related Stress: NIST Demonstrates Fatigue Effects in Silicon

November 27, 2007

Researchers at the National Institute of Standards and Technology (NIST) have demonstrated a mechanical fatigue process that eventually leads to cracks and...

NIST Presents Its Microfluidics Technologies For Commercial Adoption

October 12, 2007

A TECHNOLOGY TRANSFER AND FEDERAL MARKETPLACE EVENT NIST Presents Its Microfluidics Technologies For Commercial Adoption On Tuesday, October 9, 2007, NIST...

$Optical profilometer image of the broken surface of a glass rod shows height of peaks and valleys of the fracture surface in millionths of a meter.$

New Guide Available for Fractography of Ceramics and Glasses

September 13, 2007

The National Institute of Standards and Technology (NIST) recently issued a guide to Fractography of Ceramics and Glasses (NIST Special Publication SP 960-16)...

NIST Team Develops Novel Method for Nanostructured Polymer Thin Films

September 13, 2007

All researchers at the National Institute of Standards and Technology (NIST) wanted was a simple, quick method for making thin films of block copolymers or BCPs...

Schematic of the monolayer self-assembly process studied by the NIST/NCSU team.

Catching Waves: Measuring Self-Assembly in Action

June 21, 2007

By making careful observations of the growth of a layer of molecules as they gradually cover the surface of a small silicon rectangle, researchers from the...

NIST Develops Rapid Method for Judging Nanotube Purity

February 1, 2007

Researchers at the National Institute of Standards and Technology (NIST) have developed a sensitive new method for rapidly assessing the quality of carbon...

New Measurement Guide Worth 'Poring Over'

November 9, 2006

In industries from textiles to automobiles and from pharmaceuticals to semiconductors, accurately measuring empty spaces—technically speaking, porosity—is a...

Mass Spectrometry Methods Database Gets Major Update

May 25, 2006

Researchers at the National Institute of Standards and Technology (NIST) recently added 150 new methods—nicknamed "recipes"—to a database already containing 255...

Boettinger Elected to Engineering Academy

February 16, 2006

National Institute of Standards and Technology (NIST) metallurgist William J. Boettinger has been elected to the National Academy of Engineering (NAE), an honor...

A New Structural View of Organic Electronic Devices

September 9, 2005

Although still in the qualifying rounds, U.S. researchers are helping manufacturers win the race to develop low-cost ways to commercialize a multitude of...

Reference Materials Planned for Semiconductor Industry

June 30, 2005

Companies and research organizations are invited to collaborate with the National Institute of Standards and Technology (NIST) and SEMATECH in the development...

Colorized micrograph of a nanoporous insulation film after "wrinkling" with a new NIST measurement method.

NIST Testing Method Quickly Tells Whether Thin Films Are Strong Enough for the Job

July 12, 2004

The challenge of determining whether thin films—some no thicker than a single molecule—are strong enough for a growing number of important technology jobs just...

NIST Materials Science Pioneer John Cahn To Receive Bower Award from Franklin Institute

January 28, 2002

The Department of Commerce's National Institute of Standards and Technology (NIST) announced today that materials scientist John Cahn will receive the 2002...

Polyester Blend Aids in Scientific Pursuit of Future Composites

May 4, 1999

Scientists at the Commerce Department’s National Institute of Standards and Technology today announced that they have taken a major step toward the manufacture...

NIST Scientist Wins Nation's Highest Scientific Honor

December 8, 1998

President Clinton today named John W. Cahn (photo), a leading materials scientist at the Commerce Department's National Institute of Standards and Technology...

Advance Could Lead Eventually To Big Savings In Metal-Forming Industry

July 21, 1998

Scientists at the Commerce Department's National Institute of Standards and Technology are the first to succeed in using a new technique that shows precisely...

Failure of Tiny Rivets May Have Sunk 'Unsinkable' Liner

February 17, 1998

When the remains of the RMS Titanic were discovered more than two miles beneath the surface of the North Atlantic in 1985, the story of the great liner once...

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