Image provided by the speaker.
Manufacturability and reliability of next generation devices is sure to be a challenge in a world of post-CMOS electronics. As staying on Moore's Law becomes more technically and economically challenging, what is the path to future improvements in technology and devices? How can we continue to motivate research and development? Is collaboration the answer? Dan Armbrust will review industry economics and trends, as well as manufacturing collaboration in the semiconductor and photovoltaic industries. Current industry challenges in logic, memory, and 3D devices, defect reduction and metrology will be addressed, along with thoughts on approaching these challenges through collaboration with partners such as NIST.
Anyone outside NIST wishing to attend must be sponsored by a NIST employee and receive a visitor badge.
For more information, contact Kum Ham at 301-975-4203.
Colloquia are videotaped and available in the NIST Research Library.