Reference Materials

The Materials Measurement Science Division is actively developing new  Standard Reference Materials (SRMs) for various materials measurement techniques. For reference, we also list SRM products that have been discontinued. Please visit the full SRM webpage and NIST Store to see other SRM products.

X-Ray Diffraction and Scattering

• 1976c - Instrument Response Standard for X-Ray Powder Diffraction
• 1976b - Instrument Response Standard for X-Ray Powder Diffraction
• 640f - Line Position and Line Shape Standard for Powder Diffraction (Silicon Powder)
• 640e - Line Position and Line Shape Standard for Powder Diffraction (Silicon Powder)
• 660c - Line Position and Line Shape Standard for Powder Diffraction (LaB6 Powder)
• 1878b - Respirable Alpha Quartz (Quantitative X-Ray Powder Diffraction Standard)
• 1879b - Respirable Cristobalite (Quantitative X-Ray Powder Diffraction Standard)
• 674b - X-Ray Powder Diffraction Intensity Set (Quantitative Powder Diffraction)
• 675 - Large d-Spacing Standard for X-Ray Powder Diffraction
• 1979 - Powder Diffraction Line Profile Standard (Nano-Crystalline Zinc Oxide Powder)
• 2000 - Calibration Standard for High-Resolution X-Ray Diffraction
• 1990 - Single Crystal Diffractometer Alignment Standard - Ruby Sphere
• 3600 - Absolute Intensity Calibration Standard for Small-Angle X-ray Scattering
• 656 - Silicon Nitride Powders (Quantitative Analysis Powder Diffraction Standard) ***
• 2012 - Calibration Standard for High-Resolution X-Ray Diffraction (200 mm Wafer) ***

Particle Size Distribution

• 1021 - Glass Beads - Particle Size Distribution (2 ¬µm to 12 ¬µm diameter range)
• 1003c - Glass Beads - Particle Size Distribution (20 ¬µm to 50 ¬µm diameter range)
• 1017b - Glass Beads - Particle Size Distribution (100 ¬µm to 400 ¬µm diameter range)
• 1019b - Glass Beads - Particle Size Distribution (750 ¬µm to 2450 ¬µm diameter range)
• 1978 - Particle Size Distribution Standard for Gravity Sedimentation
• 8988 - Titanium Dioxide Powder - Particle Size Distribution
• 1004b - Glass Beads - Particle Size Distribution (40 ¬µm to 150 ¬µm diameter range) ***
• 1018b - Glass Beads - Particle Size Distribution (220 ¬µm to 750 ¬µm diameter range) ***
• 659 - Particle Size Distribution Standard for Sedigraph Calibration ***

Thermal Properties

• 3451 - Low-Temperature Seebeck Coefficient Standard (10 K to 390 K)
• 3452 - High-Temperature Seebeck Coefficient Standard (295 K to 900 K)
• 1416 - Aluminosilicate Glass for Liquidus Temperature
• 731L1 - Borosilicate Glass - Thermal Expansion
• 731L2 - Borosilicate Glass - Thermal Expansion
• 731L3 - Borosilicate Glass - Thermal Expansion
• 709 - Extra Dense Lead
• 717a - High Boron Glass Viscosity

Nanomaterials and Specific Surface Area

• 1898 - Titanium Dioxide Nanomaterial
• 8017 - Polyvinylpyrrolidone Coated Silver Nanoparticles (Nominal Diameter 75 nm)
• 2206 - Controlled Pore Glass - BET Specific Surface Area (Nominal Pore Diameter 300 nm)
• 2207 - Controlled Pore Glass - BET Specific Surface Area (Nominal Pore Diameter 18 nm)
• 1900 - Silicon Nitride Powder-Specific Surface Area Standard
• 8011 - Gold Nanoparticles (Nominal 10 nm Diameter) ***

Dust and Particulate Matter

• 8631b - Medium Test Dust (MTD)
• 8631a - Medium Test Dust (MTD)
• 2806d - Medium Test Dust (MTD) in Hydraulic Fluid
• 8632a - Ultra Fine Test Dust (UFTD)
• 8632 - Ultra Fine Test Dust (UFTD)
• 8785 - Air Particulate Matter on Filter Media
• 8786 - Filter Blank for RM 8785

Thermal Spray Powder

• 1984 - Thermal Spray Powder - Tungsten Carbide/Cobalt (Acicular)
• 1985 - Thermal Spray Powder - Tungsten Carbide/Cobalt (Spheroidal)
• 1982 - Thermal Spray Powder - Yttria-Stabilized Zirconia (Spheroidal) ***

Mechanical Properties

• 2100a - Fracture Toughness of Ceramics
• 2100b - Fracture Toughness of Ceramics
• 2830 - Knoop Hardness of Ceramics
• 2831 - Vickers Hardness
• 3461 - Standard Reference Cantilevers for AFM Spring Constant Calibration

Depth Profile

• 2137 - Boron Implant in Silicon for Calibration of Concentration in a Depth Profile
• 2135c - Ni/Cr Thin Film Depth Profile Standard
• 2133 - Phosphorus Implant in Silicon Depth Profile Standard
• 2134 - Arsenic Implant in Silicon Depth Profile Standard

Microprobe Analysis

• 481 - Gold-Silver Wires for Microprobe Analysis
• 482 - Gold-Copper Wires for Microprobe Analysis
• 480 - Tungsten - 20 % Molybdenum Alloy Electron Microprobe Standard (disk form)
• 2061 - TiAl(NbW) Alloy for Microanalysis

Other

• 622 - Soda-Lime-Silica Glass Chemical Resistance (Durability)
• 624 - Lead-Silica Glass for dc Resistivity
• 1917 - Mercury Porosimetry Standard
• 1980 - Positive Electrophoretic Mobility (+¬µE) Standard
• 1992 - Zeta Potential - Colloidal Silica (Nominal Mass Fraction 0.15 %)
• 1993 - Zeta Potential - Colloidal Silica (Nominal Mass Fraction 2.2 %)
• 2066 - K-411 Glass Microspheres
• 8010 - Sand for Sieve Analysis
• 8044 - Common Commercial Asbestos: Chrysotile
• 8983 - Silicon Nitride Powder

***SRM is discontinued