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Tools and Instruments

Keyword

Organizational Unit

X-ray Photoelectron Spectroscopy

The Material Measurement Science Division at NIST performs surface chemical analysis using X-ray Photoelectron

X-Ray Reflectometer

The NCNR x-ray diffractometer is configured to allow both θ/2θ diffraction and reflectometry. Typically Cu radiation is used with minimum resolution of Δλ=0

X-Ray Residual Stress

The diffractometer is part of the Residual Stress Program with the main purpose of measuring strains/stresses. Other possible applications are the measurement