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μ-ARPES measurement of graphene on SiC using the PEEM. The π and σ bands are discerned with HeI and HeII excitation, yellow circles identify the Dirac point.

μ-ARPES measurement of graphene on SiC using the PEEM. The π and σ bands are discerned with HeI and HeII excitation, yellow circles identify the Dirac point.

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