Scanning Electron Microscopy (SEM)
a type of electron microscope in which a focused electron beam is scanned in a raster on a solid sample surface; the term can also include the analytical technique of energy dispersive X-ray spectroscopy.
Committee
Trace Materials
Date Added to Lexicon
Standard Source (Designation Number Title of Standard. Publisher, Place, Year.)
ANSI/ASTM E1732-24e1 Standard Terminology Relating to Forensic Science. ASTM International, 100 Barr Harbor Drive, West Conshohocken, PA 19428, 2024.
Source link
Reprinted, with permission, from ASTM E1732-24e1 Standard Terminology Relating to Forensic Science, copyright ASTM International, 100 Barr Harbor Drive, West Conshohocken, PA 19428. A copy of the complete standard is available from ASTM International, https://www.astm.org