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Back to the OSAC Lexicon

Scanning Electron Microscopy (SEM)

a type of electron microscope in which a focused electron beam is scanned in a raster on a solid sample surface; the term can also include the analytical technique of energy dispersive X-ray spectroscopy.

Committee
Trace Materials
Date Added to Lexicon
Standard Source (Designation Number Title of Standard. Publisher, Place, Year.)
ANSI/ASTM E1732-24e1 Standard Terminology Relating to Forensic Science. ASTM International, 100 Barr Harbor Drive, West Conshohocken, PA 19428, 2024. Source link
Reprinted, with permission, from ASTM E1732 Standard Terminology Relating to Forensic Science, copyright ASTM International, 100 Barr Harbor Drive, West Conshohocken, PA 19428. A copy of the complete standard is available from ASTM International, https://www.astm.org
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