Escape Peak
a spectral artifact resulting from incomplete deposition of the energy of an X-ray entering the energy dispersive X-ray spectrometer detector.
Discussion—An escape peak is produced when an incoming X-ray excites a silicon atom within the detector crystal, and the resulting Si Kα fluorescence X-ray exits the detector crystal. It occurs at the energy for the original X-ray minus the energy of the Si Kα fluorescence X-ray (1.74 keV). The escape peak intensity is about 1-2 % of the parent peak.
Committee
Trace Materials
Date Added to Lexicon
Standard Source (Designation Number Title of Standard. Publisher, Place, Year.)
ANSI/ASTM E1732 Standard Terminology Relating to Forensic Science. ASTM International, 100 Barr Harbor Drive, West Conshohocken, PA 19428, 2025.
Source link
Reprinted, with permission, from ASTM E1732 Standard Terminology Relating to Forensic Science, copyright ASTM International, 100 Barr Harbor Drive, West Conshohocken, PA 19428. A copy of the complete standard is available from ASTM International, https://www.astm.org