Escape Peak
a peak resulting from incomplete deposition of the energy of an X-ray entering the energy dispersive X-ray spectrometer detector.
Discussion—This peak is produced when an incoming X-ray excites a silicon atom within the detector crystal, and the resulting Si K-α fluorescence X-ray exits the detector crystal. It occurs at the principal peak energy minus the energy of the Si K-α fluorescence X-ray (1.74 keV). The escape peak intensity is about 1 to 2 % of the parent peak.
Committee
Trace Materials
Date Added to Lexicon
Standard Source (Designation Number Title of Standard. Publisher, Place, Year.)
ANSI/ASTM E1732-24e1 Standard Terminology Relating to Forensic Science. ASTM International, 100 Barr Harbor Drive, West Conshohocken, PA 19428, 2024.
Source link
Reprinted, with permission, from ASTM E1732-24e1 Standard Terminology Relating to Forensic Science, copyright ASTM International, 100 Barr Harbor Drive, West Conshohocken, PA 19428. A copy of the complete standard is available from ASTM International, https://www.astm.org