Charging
negative charge accumulation on either a nonconductive sample or a sample that is not properly grounded.
Discussion—This effect can interfere with image formation and X-ray analysis because of beam deflection. It can usually be eliminated by the application of a conductive coating or by the use of a low vacuum system.
Committee
Trace Materials
Date Added to Lexicon
Standard Source (Designation Number Title of Standard. Publisher, Place, Year.)
ANSI/ASTM E1732 Standard Terminology Relating to Forensic Science. ASTM International, 100 Barr Harbor Drive, West Conshohocken, PA 19428, 2025.
Source link
Reprinted, with permission, from ASTM E1732 Standard Terminology Relating to Forensic Science, copyright ASTM International, 100 Barr Harbor Drive, West Conshohocken, PA 19428. A copy of the complete standard is available from ASTM International, https://www.astm.org