Scanning Electron Microscopy (Sem)
A type of electron microscope in which a focused electron beam is scanned in a raster on a solid sample surface; the term can also include the analytical technique of energy dispersive X-ray spectroscopy.
Committee
Trace Materials
Date Added to Lexicon
Standard Source (Designation Number Title of Standard. Publisher, Place, Year.)
ANSI/ASTM E2809-22 Standard Guide for Using Scanning Electron Microscopy/Energy Dispersive X-Ray Spectroscopy (SEM/EDS) in Forensic Polymer Examinations. ASTM International, 100 Barr Harbor Drive, West Conshohocken, PA 19428, 2022.
Source link
Reprinted, with permission, from ASTM, copyright ASTM International, 100 Barr Harbor Drive, West Conshohocken, PA 19428. A copy of the complete standard may be purchased from ASTM International, https://www.astm.org