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TDP Standards Development Summit - Presentations

           MBE/TDP Summit - Presentation Repository December 12 - 15, 2011
National Institute of Standards & Technology
Gaithersburg, MD




OSD MBE/TDP Summit Objectives


Paul Huang/Simon Frechette


NIST Engineering Laboratory Manufacturing Programs Overview


Vijay Srinivasan, Simon Frechette, Fred Proctor, Alkan Donmez, Mike  Shneier


NASA Integrated Model-centric Architecture


Paul Gill, NASA


Integrated Data Management Strategy in Support of MBE Life Cycle  Management


Shelley Detrich, USGC


Model-based Engineering/Manufacturing Review from Y-12 National  Security Complex


Donna Bennet, DOE


MBE Implementation at Enterprise Level Requirements


James Delaporte, NexTec

Engineered Resilient System


Scott Lucero, OSD


EDA Overview


Dennis Thompson, ATI


Industry and ManTech Interaction Success


David Baum, Raytheon




John Horst, NIST


Critical Product Tolerance Representation Requirements for MBD and  Metrology Interop.


Curtis Brown, DoE/KCP


MBD for Dimensional Quality within a Heterogeneous Supply Base


Ron Snyder, Rolls Royce


Improving First Article Inspection in a Model-Based Environment


Ray Admire, Lockheed Martin


MBE Enabler of Intelligent GD&T


Bill Tandler, MultiMetrics


TDP Validation


Roy Whittenburg, UTRC


Reducing new product introduction time and cost through more effective collaboration


John Gray, ITI TranscenData

------------  This page and the documents linked above are for archival purposes only.  -----------

Created January 9, 2012, Updated February 6, 2012