TOPIC | SPEAKER |
Paul Huang/Simon Frechette | |
Vijay Srinivasan, Simon Frechette, Fred Proctor, Alkan Donmez, Mike Shneier | |
Paul Gill, NASA | |
Integrated Data Management Strategy in Support of MBE Life Cycle Management | Shelley Detrich, USGC |
Model-based Engineering/Manufacturing Review from Y-12 National Security Complex | Donna Bennet, DOE |
James Delaporte, NexTec | |
Scott Lucero, OSD | |
Dennis Thompson, ATI | |
David Baum, Raytheon | |
John Horst, NIST | |
Critical Product Tolerance Representation Requirements for MBD and Metrology Interop. | Curtis Brown, DoE/KCP |
MBD for Dimensional Quality within a Heterogeneous Supply Base | Ron Snyder, Rolls Royce |
Improving First Article Inspection in a Model-Based Environment | Ray Admire, Lockheed Martin |
Bill Tandler, MultiMetrics | |
Roy Whittenburg, UTRC | |
Reducing new product introduction time and cost through more effective collaboration | John Gray, ITI TranscenData |
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