| TOPIC | SPEAKER |
| Paul Huang/Simon Frechette | |
| Vijay Srinivasan, Simon Frechette, Fred Proctor, Alkan Donmez, Mike Shneier | |
| Paul Gill, NASA | |
| Integrated Data Management Strategy in Support of MBE Life Cycle Management | Shelley Detrich, USGC |
| Model-based Engineering/Manufacturing Review from Y-12 National Security Complex | Donna Bennet, DOE |
| James Delaporte, NexTec | |
| Scott Lucero, OSD | |
| Dennis Thompson, ATI | |
| David Baum, Raytheon | |
| John Horst, NIST | |
| Critical Product Tolerance Representation Requirements for MBD and Metrology Interop. | Curtis Brown, DoE/KCP |
| MBD for Dimensional Quality within a Heterogeneous Supply Base | Ron Snyder, Rolls Royce |
| Improving First Article Inspection in a Model-Based Environment | Ray Admire, Lockheed Martin |
| Bill Tandler, MultiMetrics | |
| Roy Whittenburg, UTRC | |
| Reducing new product introduction time and cost through more effective collaboration | John Gray, ITI TranscenData |
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