December 11 - 13, 2012 National Institute of Standards & Technology Gaithersburg, MD
Tuesday, 11 December, 2012 |
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Topic |
Speaker(s) |
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Introductions and Admin |
Simon Frechette, NIST Paul Huang, ARL |
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Phil Zimmerman - OSD AMSWG |
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Model-Based Manufacturing |
Dean Robinson, GE Global Research |
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Richard Norton, DLA-LIS |
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Break |
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NAVAIR EIPT |
Howard Owens, NAVAIR |
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3D Model Based Scanning & Inspection |
Fred Persi, M7 Technologies |
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Vendor Updates |
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Lunch Break & Vendor Demos |
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The Quality Information Framework: MBE and XML Schema Models |
Curtis Brown, Honeywell FM&T |
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Model Based Inspection: Leveraging Model Based Definition for QA |
Ron Branch, Verisurf |
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Using Open CAD Formats to Bridge the Gap Between Today's and Tomorrow's Standards |
Tomasz Luniewski, Capvidia |
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Break & Vendor Demos |
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Model-Based Predictive Technologies for Dimensional Measurement |
Jon Baldwin, Metrosage |
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Sam Golan, PAS Technology |
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Model Based Inspection Panel: Q&A |
Moderator: John Horst |
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Wrap-Up and Vendor Demos |
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Wednesday, 12 December, 2012 | |||
Topic |
Speaker(s) |
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Announcements & Admin |
Simon Frechette, NIST |
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Mick Maher, DARPA-DSO |
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John Gray, ITI |
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Paul Gill, NASA |
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Break |
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Simon Frechette, NIST |
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Implementing Model Only at Cubic Defense Applications |
Peter Buzyna, Cubic Defense |
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Karen Kontos, Honeywell |
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NDEMC, Affordable Access to Modeling & Simulation and High Performance Computing for SMEs |
Dennis Thompson, SCRA |
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NAMII Overview |
Ed Morris, Director NAMII |
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Lunch Break & Vendor Demos |
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Lightweight Formats/Visualization Overview |
Rich Eckenrode, Recon-Services |
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David Opsahl, 3D PDF Consortium |
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Chris Garica, Anark |
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A New Dimension in Data Sharing |
Tom Barth, EOS |
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Break & Vendor Demos |
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Dennis Keating, Siemens |
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Madhavi Ramesh, PTC |
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Garth Coleman, Dassault Systems |
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Vendor Panel Discussion |
Moderator: Rich Eckenrode |
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Thursday, 13 December, 2012 |
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Topic |
Speaker(s) |
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Announcements & Admin |
Simon Frechette, NIST |
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David Stieren, NIST MEP |
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Dennis Duncan, LMI |
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Sanjay Parimi, ARDEC |
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Break |
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Richard Neal, IMTI |
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Model Standards Interoperability Across Domains, the Life Cycle, and the Supply Chain |
Charlie Stirk, CostVision |
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Tom Hannon, Lockheed Martin |
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Lunch Break |
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Fred Proctor, NIST |
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Siemens Overview |
Dennis Keating, Siemens |
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Dassault Overview |
Israel Flores, Dassault Systems |
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Delcam Overview |
Hanan Fis, Delcam |
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Break |
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Martin Hardwick, STEPTools |
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End-User Panel Discussion |
Moderator: Fred Proctor |
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Wrap-up and Path Forward |
Paul Huang |