Category: Mechanical/Materials
Developers: Los Alamos National Laboratory
Co-Developers: National Institute of Standards, Boulder, CO; University of Colorado, Boulder, CO
United States
Product Description: The hyperspectral x-ray imaging (HXI) detector provides ultra-sensitive elemental and chemical composition analysis with nanoscale spatial resolution for a wide range of materials. HXI delivers a new capability in energy resolution and efficiency for material analysis in scanning electron microscopes, allowing researchers to measure material signatures at the nanoscale.