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PUBLICATIONS

A Well Dressed Microscope: Practical Experience with Microcalorimeter and Silicon Drift Detector Systems

Published

Author(s)

John A. Small, Dale Newbury, John Henry J. Scott, L. King, Sae Woo Nam, Kent D. Irwin, Steven Deiker, Shaul Barkan, Jan Iwanczyk

Abstract

NIST, Gaithersburg has recently installed a first generation silicon drift detector (SDD) from Photon Imaging and the NIST Boulder microcalorimeter energy dispersive x-ray spectrometer (υcal-EDS) on a JEOL 840 SEM, as shown in Fig. 1. [1,2] The instrument is also equipped with a conventional Si-Li x-ray detector (LINK ISIS 3 position turret) and a JEOL wavelength dispersive x-ray spectrometer. NIST, Gaithersburg staff have had the opportunity to work with these new detector technologies as "users" and to compare preliminary results with conventional systems.
Citation
Microscopy and Microanalysis
Volume
8
Issue
suppl. 2
Pub Type
Journals
Sensors

Citation

Small, J. , Newbury, D. , Scott, J. , King, L. , Nam, S. , Irwin, K. , Deiker, S. , Barkan, S. and Iwanczyk, J. (2002), A Well Dressed Microscope: Practical Experience with Microcalorimeter and Silicon Drift Detector Systems, Microscopy and Microanalysis (Accessed December 13, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created December 30, 2002, Updated October 12, 2021