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A Well Dressed Microscope: Practical Experience with Microcalorimeter and Silicon Drift Detector Systems
Published
Author(s)
John A. Small, Dale Newbury, John Henry J. Scott, L. King, Sae Woo Nam, Kent D. Irwin, Steven Deiker, Shaul Barkan, Jan Iwanczyk
Abstract
NIST, Gaithersburg has recently installed a first generation silicon drift detector (SDD) from Photon Imaging and the NIST Boulder microcalorimeter energy dispersive x-ray spectrometer (υcal-EDS) on a JEOL 840 SEM, as shown in Fig. 1. [1,2] The instrument is also equipped with a conventional Si-Li x-ray detector (LINK ISIS 3 position turret) and a JEOL wavelength dispersive x-ray spectrometer. NIST, Gaithersburg staff have had the opportunity to work with these new detector technologies as "users" and to compare preliminary results with conventional systems.
Small, J.
, Newbury, D.
, Scott, J.
, King, L.
, Nam, S.
, Irwin, K.
, Deiker, S.
, Barkan, S.
and Iwanczyk, J.
(2002),
A Well Dressed Microscope: Practical Experience with Microcalorimeter and Silicon Drift Detector Systems, Microscopy and Microanalysis
(Accessed October 7, 2025)