Small, J.
, Newbury, D.
, Scott, J.
, King, L.
, Nam, S.
, Irwin, K.
, Deiker, S.
, Barkan, S.
and Iwanczyk, J.
(2002),
A Well Dressed Microscope: Practical Experience with Microcalorimeter and Silicon Drift Detector Systems, Microscopy and Microanalysis
(Accessed October 14, 2025)
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A Well Dressed Microscope: Practical Experience with Microcalorimeter and Silicon Drift Detector Systems
Published
Author(s)
, , John Henry J. Scott, L. King, , , , Shaul Barkan, Jan Iwanczyk
Abstract
NIST, Gaithersburg has recently installed a first generation silicon drift detector (SDD) from Photon Imaging and the NIST Boulder microcalorimeter energy dispersive x-ray spectrometer (υcal-EDS) on a JEOL 840 SEM, as shown in Fig. 1. [1,2] The instrument is also equipped with a conventional Si-Li x-ray detector (LINK ISIS 3 position turret) and a JEOL wavelength dispersive x-ray spectrometer. NIST, Gaithersburg staff have had the opportunity to work with these new detector technologies as "users" and to compare preliminary results with conventional systems.Citation
Microscopy and Microanalysis
Volume
8
Issue
suppl. 2
Pub Type
Journals
Citation
Issues
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Created December 30, 2002, Updated October 12, 2021