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Voltage Versus Magnetic Field Measurements on Nb3Sn Wires

Published

Author(s)

Loren F. Goodrich

Abstract

We measured voltage versus magnetic field (V-H}/I}) on commercial Nb3Sn wires. Typically, voltage-current (V-I) at constant field is measured to determine the critical current (Ic). Recently, V-H at constant or ramping current is being measured to assess the relative stability of Nb3Sn wires. Our low-noise measurements were made with the same equipment, apparatus, and sample mount as used in Ic measurements. High-performance Nb3Sn wires exhibit flux-jump instabilities at low magnetic fields, and low-noise V-H curves on these wires show indications of flux jumps. Two nominal 0.8 mm diameter Nb3Sn wires were measured: a high-performance wire with an Ic of 750 A at 12 T and a stable wire with an Ic of 150 A at 12 T. V-H measurements also reveal that less stable wires will quench (abrupt and irreversible transition to the normal state) at currents much smaller than Ic at the lower magnetic fields. The measured V-H curves and quench currents of these two wires are contrasted.
Proceedings Title
Transactions of the International Cryogenic Materials Conference - ICMC, Vol. 52
Volume
52B
Conference Dates
August 29-September 2, 2005
Conference Location
Keystone, CO
Conference Title
Advances in Cryogenic Engineering

Keywords

Critical current, Nb<sub>3</sub>Sn wire, quench, stability, transport current

Citation

Goodrich, L. (2006), Voltage Versus Magnetic Field Measurements on Nb<sub>3</sub>Sn Wires, Transactions of the International Cryogenic Materials Conference - ICMC, Vol. 52, Keystone, CO (Accessed April 13, 2024)
Created May 31, 2006, Updated January 27, 2020