Voltage Versus Magnetic Field Measurements on Nb3Sn Wires

Published

May 31, 2006

Author(s)

Loren F. Goodrich

Abstract

We measured voltage versus magnetic field (V-H}/I}) on commercial Nb₃Sn wires. Typically, voltage-current (V-I) at constant field is measured to determine the critical current (I_c). Recently, V-H at constant or ramping current is being measured to assess the relative stability of Nb₃Sn wires. Our low-noise measurements were made with the same equipment, apparatus, and sample mount as used in I_c measurements. High-performance Nb₃Sn wires exhibit flux-jump instabilities at low magnetic fields, and low-noise V-H curves on these wires show indications of flux jumps. Two nominal 0.8 mm diameter Nb₃Sn wires were measured: a high-performance wire with an I_c of 750 A at 12 T and a stable wire with an I_c of 150 A at 12 T. V-H measurements also reveal that less stable wires will quench (abrupt and irreversible transition to the normal state) at currents much smaller than I_c at the lower magnetic fields. The measured V-H curves and quench currents of these two wires are contrasted.

Proceedings Title

Transactions of the International Cryogenic Materials Conference - ICMC, Vol. 52

Volume

52B

Conference Dates

August 29-September 2, 2005

Conference Location

Keystone, CO

Conference Title

Advances in Cryogenic Engineering

Pub Type

Conferences

Keywords

Critical current, Nb₃Sn wire, quench, stability, transport current

Citation

Goodrich, L. (2006), Voltage Versus Magnetic Field Measurements on Nb₃Sn Wires, Transactions of the International Cryogenic Materials Conference - ICMC, Vol. 52, Keystone, CO (Accessed December 13, 2024)