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Versatile USAXS (Bonse-Hart) Facility for Advanced Materials Research
Published
Author(s)
J Ilavsky, P Jemain, Andrew J. Allen, Gabrielle G. Long
Abstract
The USAXS facility at UNICAT Sector 33 at the Advanced Photon Source (APS) is a world-class resource for advanced materials research emphasizing full-range charactrization of nanometer-scale to micrometer-scale microstructures. Receiving photons from an APS Undulator A X-ray source, the instrument delivers approximately equal to} 1013 ph s-1 incident in a 0.4 mm x 2.5 mm area at the sample position for 10 keV photons, has an incident photon energy range from 7 keV to 19 keV, a single-scan Q range (where Q = 4π/λ sin [theta}, λ is the photon wavelength, and 2 θ is the angle of scatter) from 0.0001 Angstrom}-1 to 1 Angstrom}-1, 9 decades of detector intensity range, absolute intensity calibration by primary methods, fluorescence rejection in the scattered beam, excellent energy resolution (Δ}λ / λ) for anomalous USAXS, and a miximum unfocused beam size of 0.4 mm x 2.5 mm, with spatial resolution down to 20 υm. The facility offers semi-automated data reduction, rapid and rigorous data analysis using state-of-the-art structure factors and models, and radiographic and USAXS-imaging. Both 1-D collimated (slit-smeared configuration) and 2-D collimated configurations are routinely available. Ongoing development of this facility continues in an active partnership between the instrument scientists and the user community.
Ilavsky, J.
, Jemain, P.
, Allen, A.
and Long, G.
(2017),
Versatile USAXS (Bonse-Hart) Facility for Advanced Materials Research, Proceedings of the SRI 2003 Conference, Undefined
(Accessed October 14, 2025)