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Variation of the effective magnetization and the Lande g factor with thickness in thin Permalloy films

Published

Author(s)

John P. Nibarger, Radek Lopusnik, Thomas J. Silva, Zbigniew J. Celinski

Abstract

We have simultaneously measured the Lande g factor, the effective magnetization, Meff, and the uniaxial anisotropy, Hk, and the Gilbert damping parameter α, as a function of Permalloy film thickness from 2.5 to 50 nm. We used a pulsed inductive microwave magnetometer capable of generating dc bias fields of 35.2 kA/m (440 Oe). A significant decrease in g is observed with decreasing thickness below 10 nm. Also, Meff decreases with decreasing thickness consistent with a surface anisotropy constant of 0.196plus or minus}mJ/m2. The decrease in g can arise from the orbital motion of the electrons at the interface not being quenched by the crystal filed. We also compare our data to a model of an effective g factor suggesting that the decrease in g factor might also stem from the Ni-Fe interface with a Ta underlayer.
Citation
Applied Physics Letters
Volume
83
Issue
1

Keywords

g-factor, kittel equation, magnetometer, pulsed inductive microwave, surface anisotropy

Citation

Nibarger, J. , Lopusnik, R. , Silva, T. and Celinski, Z. (2003), Variation of the effective magnetization and the Lande g factor with thickness in thin Permalloy films, Applied Physics Letters, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31261 (Accessed June 20, 2024)

Issues

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Created July 6, 2003, Updated October 12, 2021