Variable-temperature critical-current measurements on a Nb-Ti wire

Published

July 27, 2004

Author(s)

Loren F. Goodrich, Theodore C. Stauffer

Abstract

We made variable-temperature critical-current (Ic) measurements on a commercial multifilamentary Nb-Ti wire for temperatures (T) from 4 to 9 K and magnetic fields (H) from 0 to 11.5 T using transport current. The measurements cover the whole range of critical currents from less than 0.1 A to over 800 A. This sample will be useful as a variable-temperature reference wire. To verify the measurements at variable- temperature, we compared critical currents up to 600 A on a specimen that was immersed in liquid helium to those on the same specimen in flowing helium gas. This comparison indicated our ability to control and measure specimen temperature was within 35 mK. We also calibrated the magnetoresistance effect of resistive thermometers for temperatures from 4 to 35 K and magnetic fields from 0 to 12 T. The critical-current data presented include electric field-current (E-I) characteristics, and E-T characteristics at constant I and H,I_c(H) at constant T, and I_c(T) at constant H.

Proceedings Title

Advances in Cryogenic Engineering

Volume

50

Conference Dates

September 23-26, 2003

Conference Location

Anchorage, AK, USA

Conference Title

International Cryogenic Materials Conference (ICMC)

Pub Type

Conferences

Keywords

critical current, high current, n-value, Nb-Ti, superconductor, temperature margin, thermometry, variable temperature

Citation

Goodrich, L. and Stauffer, T. (2004), Variable-temperature critical-current measurements on a Nb-Ti wire, Advances in Cryogenic Engineering, Anchorage, AK, USA (Accessed April 25, 2026)

Additional citation formats