Author(s)
R M. Stroud, J H. Scott
Abstract
We demonstrate here the feasibility of valence mapping of particulate samples, and discuss the factors that limit quantitative data extraction from the maps. Three manganese oxide powder samples were characterized: a commercially obtained Mn2O3 powder; and two chemically synthesized cryptomelane K{Δ, Δ}MnO2 battery materials, one with 50 nm to 100nm grains,and one with 5nm x 10nm to 30nm rods.
Proceedings Title
Microscopy Society of America; Microscopy and Microanalysis 2000, Annual Meeting | 58th | | Springer
Conference Dates
August 1, 2000
Conference Title
Microscopy and Microanalysis Society
Keywords
EELS, electron microscopy, energy-filtered microscopy, TEM, valence mapping
Citation
Stroud, R.
and Scott, J.
(2000),
Valence Mapping of Particulate 3D-Transition Metal Oxides Using Energy-Filtered Transmission Electron Microscopy, Microscopy Society of America; Microscopy and Microanalysis 2000, Annual Meeting | 58th | | Springer (Accessed May 13, 2026)
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