Using X-Ray Topography to Study Fracture of Single-Crystal Ceramics
Robert S. Polvani, D Black
X-ray topography provides a unique view of the surfaces of single-crystal samples, both before and after fracture. The diffraction topograph, which is sensitive to local strain and/or crystallographic orientation, can be used to inspect samples prior to testing and aid in the interpretation of fracture data. We will describe the attributes of x-ray topography as applied to fracture studies and illustrate these with examples from recent experiments with sapphire optical components.