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Using X-Ray Topography to Study Fracture of Single-Crystal Ceramics

Published

Author(s)

Robert S. Polvani, D Black

Abstract

X-ray topography provides a unique view of the surfaces of single-crystal samples, both before and after fracture. The diffraction topograph, which is sensitive to local strain and/or crystallographic orientation, can be used to inspect samples prior to testing and aid in the interpretation of fracture data. We will describe the attributes of x-ray topography as applied to fracture studies and illustrate these with examples from recent experiments with sapphire optical components.
Citation
Fracture of Glasses and Ceramics

Keywords

fracture, sapphire, x-ray diffraction, x-ray topography

Citation

Polvani, R. and Black, D. (2001), Using X-Ray Topography to Study Fracture of Single-Crystal Ceramics, Fracture of Glasses and Ceramics (Accessed June 12, 2024)

Issues

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Created October 1, 2001, Updated February 19, 2017