W., J.
, Cheggour, N.
, Goodrich, L.
and Splett, J.
(2017),
Unified scaling law for flux pinning in practical superconductors: Part 3. Extrapolations from minimum datasets and applications of the extrapolative scaling expression, Superconductor Science & Technology, [online], https://doi.org/10.1088/1361-6668/30/3/033005
(Accessed September 19, 2024)
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Unified scaling law for flux pinning in practical superconductors: Part 3. Extrapolations from minimum datasets and applications of the extrapolative scaling expression
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Author(s)
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Abstract
The accuracy of present fitting equations to interpolate and extrapolate full Ic(B,T,ε) datasets is evaluated and compared with the extrapolative scaling expression (ESE) derived in Part 2. Accuracy is analyzed in terms of RMS error and fractional deviation statistics. Highlights from 92 test cases are condensed and summarized, covering most fitting protocols and proposed parameterizations of the unified scaling law. The results show that the ESE can extrapolate critical currents at fields, temperatures, and strains that are remarkably different from the fitted minimum dataset, with errors approaching typical Ic measurement errors.Citation
Superconductor Science & Technology
Volume
30
Pub Type
Journals
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Keywords
Superconductors, critical current, scaling laws, niobium-tin
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Created February 16, 2017, Updated June 2, 2021