Unified scaling law for flux pinning in practical superconductors: Part 3. Extrapolations from minimum datasets and applications of the extrapolative scaling expression
John (Jack) W. Ekin, Najib Cheggour, Loren F. Goodrich, Jolene D. Splett
The accuracy of present fitting equations to interpolate and extrapolate full Ic(B,T,ε) datasets is evaluated and compared with the extrapolative scaling expression (ESE) derived in Part 2. Accuracy is analyzed in terms of RMS error and fractional deviation statistics. Highlights from 92 test cases are condensed and summarized, covering most fitting protocols and proposed parameterizations of the unified scaling law. The results show that the ESE can extrapolate critical currents at fields, temperatures, and strains that are remarkably different from the fitted minimum dataset, with errors approaching typical Ic measurement errors.
, Cheggour, N.
, Goodrich, L.
and Splett, J.
Unified scaling law for flux pinning in practical superconductors: Part 3. Extrapolations from minimum datasets and applications of the extrapolative scaling expression, Superconductor Science & Technology, [online], https://doi.org/10.1088/1361-6668/30/3/033005
(Accessed July 31, 2021)