Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Unified scaling law for flux pinning in practical superconductors: Part 3. Extrapolations from minimum datasets and applications of the extrapolative scaling expression

Published

Author(s)

John (Jack) W. Ekin, Najib Cheggour, Loren F. Goodrich, Jolene D. Splett

Abstract

The accuracy of present fitting equations to interpolate and extrapolate full Ic(B,T,ε) datasets is evaluated and compared with the extrapolative scaling expression (ESE) derived in Part 2. Accuracy is analyzed in terms of RMS error and fractional deviation statistics. Highlights from 92 test cases are condensed and summarized, covering most fitting protocols and proposed parameterizations of the unified scaling law. The results show that the ESE can extrapolate critical currents at fields, temperatures, and strains that are remarkably different from the fitted minimum dataset, with errors approaching typical Ic measurement errors.
Citation
Superconductor Science & Technology
Volume
30

Keywords

Superconductors, critical current, scaling laws, niobium-tin

Citation

W., J. , Cheggour, N. , Goodrich, L. and Splett, J. (2017), Unified scaling law for flux pinning in practical superconductors: Part 3. Extrapolations from minimum datasets and applications of the extrapolative scaling expression, Superconductor Science & Technology, [online], https://doi.org/10.1088/1361-6668/30/3/033005 (Accessed July 31, 2021)
Created February 16, 2017, Updated June 2, 2021