Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Uncertainty of temperature measurements by infrared thermography for metal cutting applications

Published

Author(s)

Brandon M. Lane, Eric P. Whitenton, Viswanathan Madhavan, M A. Donmez

Abstract

This paper presents the methodology and results of a comprehensive measurement uncertainty analysis for infrared thermography of a cutting tool during the metal cutting process. The analysis is based on a commercial off-the-shelf (COTS) camera, typical of what may be used in metal cutting research. The temperature measurement equation is derived based on physics principles and compared to others used in thermography literature. An analytical method determines components of standard uncertainty, which are presented with respect to measured object temperature and measurement variables. A Monte Carlo simulation expands on the analytical method by providing comparable and additional uncertainty components to verify analytical results. Additional components include point spread function, chip and tool interactions, and motion blur. The measurement example results in an expanded uncertainty of U = 54.3 °C (k=2) when measuring maximum tool temperature, with tool emissivity and point spread function contributing the most to the measurement uncertainty.
Citation
Metrologia

Keywords

uncertainty, thermography, machining, infrared, Monte Carlo

Citation

Lane, B. , Whitenton, E. , Madhavan, V. and Donmez, M. (2013), Uncertainty of temperature measurements by infrared thermography for metal cutting applications, Metrologia, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=913632 (Accessed October 10, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created December 31, 2013, Updated June 2, 2021