Uncertainty of the Ohm Using Cryogenic and Non-Cryogenic Bridges

Published

July 8, 2018

Author(s)

Alireza Panna, Marlin E. Kraft, Albert Rigosi, George R. Jones Jr., Shamith Payagala, Mattias Kruskopf, Dean G. Jarrett, Randolph Elmquist

Abstract

We describe recent scaling measurements to decade resistance levels based on both cryogenic and non-cryogenic current comparator bridges. National measurement institutes and the International Bureau of Weights and Measures derive traceability for the SI ohm using the quantum Hall effect, with the primary comparisons made at the resistance value RK-90/2 = 12906.4035 Ω. Cryogenic current comparator scaling methods are preferred since large resistance ratios of 100 or more are achieved with unsurpassed uncertainty. The quantized Hall resistance standard based on graphene soon could allow less complex and more cost-effective room-temperature resistance bridges to provide SI traceability. Estimates of the relative uncertainties of the possible scaling methods will be provided in this report, along with a discussion of the advantages of several scaling paths.

Proceedings Title

CPEM 2018 Conference Digest

Conference Dates

July 8-13, 2018

Conference Location

Paris, FR

Conference Title

Conference on Precision Electromagnetic Measurements (CPEM) 2018

Pub Type

Conferences

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Keywords

quantized Hall resistance, traceability, cryogenic current comparator, direct current comparator, standard resistor

Citation

Panna, A. , Kraft, M. , Rigosi, A. , Jones Jr., G. , Payagala, S. , Kruskopf, M. , Jarrett, D. and Elmquist, R. (2018), Uncertainty of the Ohm Using Cryogenic and Non-Cryogenic Bridges, CPEM 2018 Conference Digest, Paris, FR, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=925092 (Accessed April 19, 2024)