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Ultra-Small Angle X-ray Scattering Instrument at the Advanced Photon Source, History, Recent Development, and Current Status

Published

Author(s)

Andrew J. Allen, Fan Zhang, Lyle E. Levine, Gabrielle G. Long, Jan Ilavsky, Pete R. Jemian

Abstract

The history and development over more than 25 years is presented and discussed of an ultra-small-angle X-ray scattering (USAXS) instrument dedicated to serving a broad range of materials research needs. This history is traced from the instrument’s origins as a collaborative development project between the National Institute of Standards and Technology (NIST) and Northwestern University, through its initial development and application at the National Synchrotron Light Source (NSLS), Brookhaven National Laboratory, and its transfer from NSLS to the Advanced Photon Source (APS), Argonne National Laboratory. The USAXS instrument’s subsequent development and application at the APS in collaboration with NIST is described, and the recent, ongoing, major enhancements of the instrument at APS, in collaboration with both NIST and the University of Chicago’s Chemistry and Materials Center for Advanced Radiation Science (ChemMatCARS), are discussed. The progressive improvements in hardware and software, and in general instrument performance and capability, are quantitatively detailed, and examples provided that exploit these improvements.
Citation
Metallurgical and Materials Transactions A-Physical Metallurgy and Materials Science
Volume
44A

Keywords

materials microstructure characterization, ultra-small-angle X-ray scattering, synchrotron radiation instrumentation, X-ray imaging, photon correlation spectroscopy, X-ray scattering data reduction and analysis tools

Citation

Allen, A. , Zhang, F. , Levine, L. , Long, G. , Ilavsky, J. and Jemian, P. (2013), Ultra-Small Angle X-ray Scattering Instrument at the Advanced Photon Source, History, Recent Development, and Current Status, Metallurgical and Materials Transactions A-Physical Metallurgy and Materials Science, [online], https://doi.org/10.1007/s11661-012-1431-y (Accessed December 11, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created January 1, 2013, Updated November 10, 2018