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Ultra-small-angle X-ray scattering at the Advanced Photon Source

Published

Author(s)

Pete R. Jemian, Jan Ilavsky, Andrew J. Allen, Fan Zhang, Lyle E. Levine, Gabrielle G. Long

Abstract

The design and operation of a versatile ultra-small-angle X-ray scattering (USAXS) instrument at the Advanced Photon Source (APS) at Argonne National Laboratory are presented. The instrument is optimized for the high brilliance and low emittance of an APS undulator source. It has angular and energy resolutions of the order of 10-4, accurate and repeatable X-ray energy tunability over its operational energy range from 8 keV 18 keV, and excellent signal-to-noise. It further offers quantitative primary calibration of X-ray scattering cross sections, a scattering vector range from 0.0001 -1 to 1 -1, and stability and reliability over extended running periods. Its operational configurations include one-dimensional collimated (slit smeared) USAXS, two-dimensional collimated USAXS, and USAXS imaging. A robust data reduction and data analysis package, which was developed in parallel with the instrument, is available and supported at the APS.
Citation
Journal of Applied Crystallography
Volume
42

Keywords

small-angle X-ray scattering, instrumentation, microstructure characterization, synchrotron radiation

Citation

Jemian, P. , Ilavsky, J. , Allen, A. , Zhang, F. , Levine, L. and Long, G. (2009), Ultra-small-angle X-ray scattering at the Advanced Photon Source, Journal of Applied Crystallography, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=854464 (Accessed May 31, 2023)
Created June 11, 2009, Updated October 12, 2021