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PUBLICATIONS

Transportation Effect of the Ni-Cr Based Metal-Foil Standard Resistors in the Trilateral Comparison Pilot Study between KRISS, NIST and NMIJ

Published

Author(s)

Randolph E. Elmquist, Nobu-hisa Kaneko, Takehiko Oe, Wan-Seop Kim, Dong Hun Chae, Marlin E. Kraft

Abstract

This paper describes a study on the transportation effect using four 100 Ω standard resistors of a new construction. All resistors have been transported by air: two of the resistors in hand-carried luggage and the other two by normal air freight. The standards have been measured by three national metrology institutes, the Korean Research Institute of Standards, the National Institute of Standards and Technology in USA and the National Metrology Institute of Japan by means of their primary national standards based on the quantum Hall effect. No noticeable difference between the two transportation methods has been detected within a standard uncertainty of 0.01 µΩ/Ω and performance suitable for international comparisons of this type of resistors has been demonstrated.
Proceedings Title
Digest of the Conference on Precision Electromagnetic Measurements

Conference Dates
August 24-29, 2014
Conference Location
Rio de Janeiro
Conference Title
Conference on Precision Electromagnetic Measurements (CPEM) 2014
Pub Type
Conferences

Keywords

international comparison, resistance standard, standard resistor, transportation effect, quantum Hall effect
Metrology and Reference materials

Citation

Elmquist, R. , Kaneko, N. , Oe, T. , Kim, W. , , D. and Kraft, M. (2014), Transportation Effect of the Ni-Cr Based Metal-Foil Standard Resistors in the Trilateral Comparison Pilot Study between KRISS, NIST and NMIJ, Digest of the Conference on Precision Electromagnetic Measurements , Rio de Janeiro, -1 (Accessed October 8, 2025)

Issues

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Created August 1, 2014, Updated February 19, 2017
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