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Temperature-Resolved Infrared Spectral Normal Emissivity of SiC and Pt-10Rh for Temperatures up to 900 C

Author(s)

Claus Cagran, Leonard M. Hanssen, Mart Noorma, Alex Gura, Sergey Mekhontsev

Abstract

This paper reports the first comprehensive results obtained from a fully functional, recently established infrared spectral emissivity capability at National Institute of Standards and Technology (NIST). First, sample surface temperatures are obtained with a radiometer using actual emittance values from a newly designed sphere reflectometer and a comparison between the radiometer temperatures and contact thermometers is presented. Spectral emissivity measurements are further made by comparison of the sample spectral radiance to that of a reference blackbody at a similar (but not identical) temperature. Initial materials selected for measurement are potential candidates for use as spectral emissivity standards or are of particular technical interest. Temperature-resolved measurements of the spectral directional emissivity of SiC, and Pt-10Rh have been measured in the spectral range of 2 - 20 m, over a temperature range of 300 C up to 900 C at normal incidence. Further, a careful study of the uncertainty components of this measurement is presented.
Citation
International Journal of Thermophysics

Keywords

infrared, platinum-10%rhodium, silicon-carbide, spectral emissivity, spectral emittance, sphere reflectomer

Citation

Cagran, C. , Hanssen, L. , Noorma, M. , Gura, A. and Mekhontsev, S. (1970), Temperature-Resolved Infrared Spectral Normal Emissivity of SiC and Pt-10Rh for Temperatures up to 900 C, International Journal of Thermophysics, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=841038 (Accessed August 9, 2022)
Created April 20, 2018, Updated April 19, 2018