Larson, D.
and Paulter, N.
(2000),
Temperature Effects on the High Speed Response of Digitizing Sampling Oscilloscopes, Proc. 2000 National Conference of Standards Laboratories Workshop and Symposium (NCSL), Toronto , 1, CA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=18414
(Accessed December 7, 2024)
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Temperature Effects on the High Speed Response of Digitizing Sampling Oscilloscopes
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Abstract
We describe the effects of temperature on the performance of 20 GHz and 50 GHz digital sampling oscilloscopes and high speed pulse generators. The temperature of the sampling heads is varied through the manufacturer's specified minimum operating temperature range (15 degrees}C to 35 degrees}C) and the corresponding changes in the measured pulse amplitude, top level, base level, and transition duration (rise time) of a step-like pulse are presented. We also describe the effects of temperature on the pulses produced by two reference step generators commonly used to perform oscilloscope calibrations. Some of the measured changes with temperature are quite large.Proceedings Title
Proc. 2000 National Conference of Standards Laboratories Workshop and Symposium (NCSL)
Conference Dates
July 16-20, 2000
Conference Location
Toronto , 1, CA
Pub Type
Conferences
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Keywords
digital sampling oscilloscope, sampling head, step generator, temperature, uncertainty
Citation
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Created June 30, 2000, Updated October 12, 2021