Temperature Effects on the High Speed Response of Digitizing Sampling Oscilloscopes

Published

July 1, 2000

Author(s)

Donald R. Larson, Nicholas Paulter

Abstract

We describe the effects of temperature on the performance of 20 GHz and 50 GHz digital sampling oscilloscopes and high speed pulse generators. The temperature of the sampling heads is varied through the manufacturer's specified minimum operating temperature range (15 degrees}C to 35 degrees}C) and the corresponding changes in the measured pulse amplitude, top level, base level, and transition duration (rise time) of a step-like pulse are presented. We also describe the effects of temperature on the pulses produced by two reference step generators commonly used to perform oscilloscope calibrations. Some of the measured changes with temperature are quite large.

Proceedings Title

Proc. 2000 National Conference of Standards Laboratories Workshop and Symposium (NCSL)

Conference Dates

July 16-20, 2000

Conference Location

Toronto , 1, CA

Pub Type

Conferences

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Keywords

digital sampling oscilloscope, sampling head, step generator, temperature, uncertainty

Citation

Larson, D. and Paulter, N. (2000), Temperature Effects on the High Speed Response of Digitizing Sampling Oscilloscopes, Proc. 2000 National Conference of Standards Laboratories Workshop and Symposium (NCSL), Toronto , 1, CA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=18414 (Accessed October 27, 2025)