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PUBLICATIONS

Technology Readiness Levels for Randomized Bin Picking

Published

Author(s)

Jeremy A. Marvel, Roger D. Eastman, Geraldine S. Cheok, Kamel S. Saidi, Tsai Hong Hong, Elena R. Messina

Abstract

A proposal for the utilization of Technology Readiness Levels to the application of unstructured bin picking is discussed. A special session was held during the 2012 Performance Metrics for Intelligent Systems workshop to discuss the challenges and opportunities associated with the bin picking problem, and to identify the potentials for applying an industry-wide standardized assessment and reporting framework such as Technology Readiness Levels to bin picking. Representative experts from government, academia, and industry were assembled to form a special panel to share their insights into the challenge.
Proceedings Title
2012 Performance Metrics for Intelligent Systems Workshop
Conference Dates
March 20-22, 2012
Conference Location
College Park, MD
Pub Type
Conferences

Download Paper

Local Download

Keywords

Bin Picking, Technology Readiness, 6DOF Metrology
Manufacturing, Robotics and Metrology

Citation

Marvel, J. , Eastman, R. , Cheok, G. , Saidi, K. , , T. and Messina, E. (2012), Technology Readiness Levels for Randomized Bin Picking, 2012 Performance Metrics for Intelligent Systems Workshop, College Park, MD, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=911421 (Accessed October 12, 2025)

Issues

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Created June 13, 2012, Updated February 19, 2017
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