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Synthetic Incoherence for Electron Microscopy



Zachary H. Levine, Robyn M. Dunstan


Tomographic studies of submicrometer samples in materials science using electron microscopy have been inhibited by diffraction effects. In the present work, we describe two practical methods for ameliorating these effects. In one, the sample is scanned over a square region. The mutual coherence function tends to zero faster than for hollow-cone illumination. In the other, Gaussian-weighted solid-cone illumination leads to an extremely localized mutual coherence function. The continuous solid-cone illumination can be implemented practically by repeated use of hollow-cone illumination with the cone angles chosen to make a Gaussian quadrature. Numerical and analytic results are presented.
Journal of the Optical Society of America A-Optics Image Science and Vision


tilt axis, tomography, transmission electron microscope


Levine, Z. and Dunstan, R. (2007), Synthetic Incoherence for Electron Microscopy, Journal of the Optical Society of America A-Optics Image Science and Vision, [online], (Accessed April 14, 2024)
Created July 11, 2007, Updated February 17, 2017