Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Synthetic Incoherence for Electron Microscopy

Published

Author(s)

Zachary H. Levine, Robyn M. Dunstan

Abstract

Tomographic studies of submicrometer samples in materials science using electron microscopy have been inhibited by diffraction effects. In the present work, we describe two practical methods for ameliorating these effects. In one, the sample is scanned over a square region. The mutual coherence function tends to zero faster than for hollow-cone illumination. In the other, Gaussian-weighted solid-cone illumination leads to an extremely localized mutual coherence function. The continuous solid-cone illumination can be implemented practically by repeated use of hollow-cone illumination with the cone angles chosen to make a Gaussian quadrature. Numerical and analytic results are presented.
Citation
Journal of the Optical Society of America A-Optics Image Science and Vision
Volume
24
Issue
8

Keywords

tilt axis, tomography, transmission electron microscope

Citation

Levine, Z. and Dunstan, R. (2007), Synthetic Incoherence for Electron Microscopy, Journal of the Optical Society of America A-Optics Image Science and Vision, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=840249 (Accessed April 14, 2024)
Created July 11, 2007, Updated February 17, 2017