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Sustainable Manufacturing: Metrics, Standards, and Infrastructure - Workshop Summary

Published

Author(s)

Sudarsan Rachuri, Ram D. Sriram, Anantha Narayanan Narayanan, Prabir Sarkar, Jae H. Lee, Kevin W. Lyons, Sharon J. Kemmerer

Abstract

This report summarizes the presentations, discussions, and recommendations of the NIST Workshop Sustainable Manufacturing: Metrics, Standards, and Infrastructure held at NIST, Gaithersburg, Maryland, USA, October 13th through October 15th, 2009. The primary objective of this workshop was to bring together experts and various stakeholders to identify and discuss measurement and standards enablers that positively affect the social, economic, environmental, and technological aspects of designing sustainable production processes and products. The workshop was well attended and consisted of thirty presentations organized under five sessions: 1) Government Initiatives; 2) Industry Perspectives; 3) University Research; 4) Non-Government Organizations (NGOs) research; and 5) Solution Provider s Views. Two breakout sessions and an industry panel provided a set of recommendations for addressing critical issues in sustainable manufacturing.
Proceedings Title
Proceedings of The 6th annual IEEE Conference on Automation Science and Engineering (IEEE CASE) 2010
Conference Dates
August 21-24, 2010
Conference Location
Toronto, Ontario,

Keywords

Sustainable Manufacturing, Environmental impact, Life Cycle Assessment, Product Life Cycle, RoHS, REACH, ISO, Standards, NIST workshop

Citation

Rachuri, S. , Sriram, R. , , A. , Sarkar, P. , Lee, J. , Lyons, K. and Kemmerer, S. (2010), Sustainable Manufacturing: Metrics, Standards, and Infrastructure - Workshop Summary, Proceedings of The 6th annual IEEE Conference on Automation Science and Engineering (IEEE CASE) 2010, Toronto, Ontario, , [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=905837 (Accessed May 29, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created May 31, 2010, Updated February 19, 2017