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Survey of Background Scattering from Materials found in Small-Angle Neutron Scattering

Published

Author(s)

John Barker, David F. Mildner

Abstract

Measurements and calculations of beam attenuation and background scattering for common materials placed in a neutron beam are presented over the temperature range of 300 K to 700 K. Time-of-flight (TOF) measurements have also been made to determine the fraction of the background that is either inelastic or quasi-elastic scattering. Other background sources considered including double Bragg diffraction from windows or samples, scattering from gases and phonon scattering from solids. We discuss methods of maximizing the signal-to-nose (S/N) by material selection, choice of sample thickness and wavelength, removal of inelastic background by TOF or filters, and removal of spin flip scattering with polarized beam analysis.
Citation
Journal of Applied Crystallography
Volume
48

Keywords

Small angle neutron scattering, background scattering, multiple scattering, inelastic scattering, phonons, double Bragg scattering

Citation

Barker, J. and Mildner, D. (2017), Survey of Background Scattering from Materials found in Small-Angle Neutron Scattering, Journal of Applied Crystallography, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=918036 (Accessed May 28, 2024)

Issues

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Created February 19, 2017