Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Surface roughness and height-height correlations dependence on thickness of YBaCuO thin films

Published

Author(s)

Basil Blank, M E. Bijlsma, R. Moerman, H Rogalla, F. J. Stork, Alexana Roshko

Abstract

For high Tc superconducting multilayer applications, smooth interfaces between the individual layers are required. However, in general, e.g., YBaCuO grows in a 3D screw-dislocation or island nucleation growth mode, introducing a surface roughness. In this contribution we study the surface layer roughness as a function of different depostion techniques as well as deposition parameters. Special attention will be paid to the increase in film thickness. For these studies we used scanning probe microscopy. From these experiments, we obtained an island density decreasing with a square root dependence on the film thickness. Furthermore, height-height correlations indicate that the film growth can be described by a ballistic growth process, with very limited effective surface diffusion. The correlationlengths ξ are on the order of the island size, inferring that the island size forms the mean diffusion barrier. This results in a representation of non-correlated islands, which can be considered as autonomous systems.
Citation
Journal of Alloys and Compounds
Volume
251

Keywords

superconductors, surface roughness, YBaCuO thin films

Citation

Blank, B. , Bijlsma, M. , Moerman, R. , Rogalla, H. , Stork, F. and Roshko, A. (1997), Surface roughness and height-height correlations dependence on thickness of YBaCuO thin films, Journal of Alloys and Compounds, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=30197 (Accessed December 11, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created March 31, 1997, Updated October 12, 2021